ANRITSU CORPORATION has announced that its test solution for the latest USB4 Version 2.0 (USB4 v2) communication standard has been officially certified by the USB Implementers Forum (USB-IF).
Built on the Signal Quality Analyzer-R MP1900A platform, the solution enables advanced evaluation of USB devices. It enhances the quality and reliability of products implementing the USB4 Version 2.0 standard, supporting broader adoption of next-generation high-speed interfaces.
As of December 2025, USB4 v2 stands as the most advanced USB standard, delivering data transfer speeds of up to 80 Gbit/s, which is twice the speed of USB4 v1 (40 Gbit/s). This enables next-generation applications such as high-resolution video transmission, external GPUs, high-speed storage solutions, and VR/AR devices.
In addition, the specification introduces major improvements in communication performance and reliability. Key innovations include Pulse Amplitude Modulation 3-level (PAM3) for enhanced bandwidth efficiency, the Frequency Variation Profile to improve the stability of link training the signal quality and initialization process and a new TS2.CLKSW training sequence that supports seamless clock switching.
Current demand for evaluation and certification testing is being led by semiconductor manufacturers developing USB4 v2 control ICs. As the ecosystem matures, adoption is expected to broaden to third-party test houses for equipment deployment and, eventually, to consumer product manufacturers producing USB4 v2–enabled hubs, docking stations, and cables.
Signal Quality Analyzer-R MP1900A: Overview
The MP1900A is a high-performance Bit Error Rate Tester (BERT) designed for receiver testing across a wide range of high-speed interfaces, including PCIe, USB, Thunderbolt, DisplayPort, and 400 GbE/800 GbE. It integrates industry-leading PPG technology for generating high-quality waveforms, a high-sensitivity error detector, and precision jitter sources (SJ, RJ, SSC, BUJ) along with noise sources (CM-I, DM-I). The MP1900A also supports link training and LTSSM analysis, enabling comprehensive evaluation of advanced high-speed devices.
